ASTM B878-1997(2003) 电气接触和连接件毫微秒间隙检测的标准试验方法

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【英文标准名称】:StandardTestMethodforNanosecondEventDetectionforElectricalContactsandConnectors
【原文标准名称】:电气接触和连接件毫微秒间隙检测的标准试验方法
【标准号】:ASTMB878-1997(2003)
【标准状态】:现行
【国别】:
【发布日期】:1997
【实施或试行日期】:
【发布单位】:美国材料与试验协会(US-ASTM)
【起草单位】:B02.11
【标准类型】:(TestMethod)
【标准水平】:()
【中文主题词】:
【英文主题词】:eventdetection;nanosecondevents;nanosecondintermittences
【摘要】:Thetestsinthistestmethodaredesignedtoassesstheresistancestabilityofelectricalcontactsorconnections.Thedescribedproceduresareforthedetectionofeventsthatresultfromshortduration,high-resistancefluctuations,orofvoltagevariationsthatmayresultinimpropertriggeringofhighspeeddigitalcircuits.Inthoseprocedures,thetestcurrentsare100mA(x00B1;20mA)whenthetestsamplehasaresistancebetween0and10x03A9;.Sincetheminimumresistancechangerequiredtoproduceanevent(definedin3.2.1)isspecifiedas10x03A9;(see1.3),thevoltageincreaserequiredtoproducethiseventmustbeatleast1.0V.Thedetectionofnanosecond-durationeventsisconsiderednecessarywhenanapplicationissusceptibletonoise.However,theseproceduresarenotcapableofdeterminingtheactualdurationoftheeventdetected.Theintegrityofnanosecond-durationsignalscanonlybemaintainedwithtransmissionlines;therefore,contactsinseriesareconnectedtoadetectorchannelthroughcoaxialcable.Thedetectorwillindicatewhentheresistancemonitoredexceedstheminimumeventresistanceformorethanthespecifiedduration.Thetestconditiondesignationcorrespondingtoaspecificminimumeventdurationof1,10,or50nsislistedinTable1.Theseshallbespecifiedinthereferencingdocument.TABLE1TestConditionDesignationsforSpecificMinimumEventDurationsTestConditionEventDuration,min
A
1nanosecond
B
10nanoseconds
C
50nanoseconds