ISO 29301-2010 微光束分析.分析的透射电子显微镜法.具有周期性结构的基准物质校准图像放大的方法

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【英文标准名称】:Microbeamanalysis-Analyticaltransmissionelectronmicroscopy-Methodsforcalibratingimagemagnificationbyusingreferencematerialshavingperiodicstructures
【原文标准名称】:微光束分析.分析的透射电子显微镜法.具有周期性结构的基准物质校准图像放大的方法
【标准号】:ISO29301-2010
【标准状态】:现行
【国别】:国际
【发布日期】:2010-06
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC202
【标准类型】:()
【标准水平】:()
【中文主题词】:分析;分析法;校准;定义;衍射;电子束;电子衍射;电子显微镜;调焦点;图像产品;放大;分析方法;微量分析;显微术;光学仪器;图象传输;换算;清晰度;传输
【英文主题词】:Analysis;Analyticalmethods;Calibration;Definitions;Diffraction;Electronbeams;Electrondiffraction;Electronmicroscopes;Electronmicroscopy;Focusing;Imageproduction;Magnification;Methodsofanalysis;Microanalysis;Microscopy;Opticalinstruments;Picturetransmissions;Scaling;Sharpness;Transmission
【摘要】:ThisInternationalStandardspecifiesacalibrationprocedureapplicabletoimagesrecordedoverawidemagnificationrangeinatransmissionelectronmicroscope(TEM).Thereferencematerialsusedforcalibrationpossessaperiodicstructure,suchasadiffractiongratingreplica,asuper-latticestructureofsemiconductororananalysingcrystalforX-rayanalysis,andacrystallatticeimageofcarbon,goldorsilicon.ThisInternationalStandardisapplicabletothemagnificationoftheTEMimagerecordedonaphotographicfilm,oranimagingplate,ordetectedbyanimagesensorbuiltintoadigitalcamera.ThisInternationalStandardalsoreferstothecalibrationofascalebar.ThisInternationalStandarddoesnotapplytothededicatedcriticaldimensionmeasurementTEM(CD-TEM)andthescanningtransmissionelectronmicroscope(STEM).
【中国标准分类号】:N32
【国际标准分类号】:37_020
【页数】:48P.;A4
【正文语种】:英语